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JEOL Inspection Stage Chamber Assembly JWS-2000 Wafer Defect Review SEM Working Model No: PDSTLCS-A

SKU: 7329546103

4.4
USD1255.10 USD1279.10

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Description

Model No: PDSTLCS-A

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Removed from a Hitachi I-900SRT Wafer Defect Inspection Tool This Hitachi 571-7022 Processor VME PCB Card AFADC00 I-900SRT is used working surplus

Part No: 455-60-15

Inventory # CONF-1158

JEOL Inspection Stage Chamber Assembly JWS-2000 Wafer Defect Review SEM Working Model No: PDSTLCS-AJEOL Inspection Stage Chamber Assembly JWS 2000 Wafer Defect Review SEM Working Inventory # CONF 1322 Part No: Inspection Stage Chamber Assembly Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System Installed Components Copal Electronics Part No: PS83 102V Keyence Part No: FS V31 Koganei Part No: JDAS12x5 74W Omron Part No: E3X A11 Oriental Motor Part No: PX535MH B, VEXTA SMC Part No: CDRQB20 01 476 This JEOL

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